Li-ion Battery Laboratory Testing Equipment

X-ray Fluorescence Spectrometer

The X-ray Fluorescence Spectrometer (XRF) is an instrument used for elemental analysis by measuring the fluorescent X-rays emitted by a material when it is exposed to X-ray radiation. XRF enables rapid, non-destructive analysis of solid, liquid, and powder samples and is commonly used for both qualitative and quantitative analysis of materials. It can detect almost all elements from the periodic table (except hydrogen and helium) and is widely applied in fields such as geology, environmental monitoring, metallurgy, materials science, and chemical analysis. It is particularly suitable for elemental analysis of metals, ores, waste, and environmental samples.

Description
Dimensions (Height x Width x Depth)	70 (Width) x 60 (Depth) x 38 (Height) cm, or 56 cm (Height) with sample changer
Power Supply	100-240 V
Computer	Internal computer with Windows operating system
Sample Size	Diameter ≤ 52 mm
Sample Switching	Automatic sample switching robotic arm
Compatible Sample Types	Solid, liquid, and powder samples – no acid digestion required
Excitation	4 – 60 kV
Drift	Non-tungsten filament technology (ZETA) for minimal tube drift
Operating Temperature	10 – 30°C
Sensitivity	50 µm thin window for optimal light element sensitivity
Protection	Chi-blue coating enhances beryllium window contamination protection
Photon Counting	6 million photons per second at 50% idle time
Power Consumption	200 W

X-ray Fluorescence Spectrometer

ICP-OES

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